ATE(Automatic Test Equipment) is an automated test equipment it is widely used in the electronics manufacturing industry to test the function and performance of electronic products. Among them, the IDD test is one of the key tests in the ATE system, which is used to detect the maximum input current of the power module. This article will introduce the definition, principles, steps of IDD testing and its importance in the electronics manufacturing industry.

1. Definition of IDD test

IDD(Input Drain Current) refers to the overall average drain or drain current that an IC chip or other integrated circuit draws or discharges from the power supply terminal under operating conditions. The IDD test is to use the ATE system to supply power to the device under test and detect the maximum drain or drain current drawn or discharged at its input.

2. IDD test principle

the IDD test is mainly based on two principles: static power consumption and dynamic power consumption.

• Static power consumption: When the device to be tested is in working state, due to the internal transistor on and off and other factors, static power consumption will inevitably consume a certain amount of power. These static power consumptions typically manifest themselves as constant direct current (DC) biases and can be calculated by directly measuring the direct current (DC) biases on the respective pins.
• dynamic power consumption: When the device to be tested is in a switching state, due to factors such as the internal transistor switching on and off, dynamic power consumption will occur, that is, different amounts of energy will be consumed according to signal frequency changes. These dynamic power consumption are usually expressed as alternating signals, and need to collect and analyze the accumulated energy in the positive and negative half-cycle cycles on the corresponding pins to calculate.

According to the above principles, when performing IDD tests, attention should be paid to selecting suitable stability, high accuracy and good bandwidth characteristics to ensure accurate sampling and analysis results.

3. IDD test steps

the following is a typical example of how to do an IDD test:

step 1: Build the connection

first of all, set up the correct connection between the device under test and the instrument in the ATE system and configure the relevant parameters.

Step 2: Set the power supply conditions

set the supply pressure correctly and according to the specifications of the device under test, and provide the required stable direct current (DC) input to the device under test through a dedicated interface.

Step 3: Start Data Sampling

use the data acquisition module to start data recording and sampling the input of the device under test.

Step 4: Analyze the data

the key information that has been recorded shall be processed by the supporting software of ATE system, including but not limited to the corresponding information such as average value, peak value and waveform diagram.

Step 5: Evaluation of results

according to the results of the analysis, evaluate whether the tested device meets the standard of the specification, and give the conclusion feedback.